ETS 2008 - Call for Papers

CALL FOR PAPERS

Overview -- Publications -- Submissions -- Key Dates -- Further Information -- Committees

Overview

The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in the area of electronic-based circuit and system testing. In 2008, ETS will take place in the nice town of Verbania, Piedmont, Lago Maggiore lakeside. ETS’08 is being organized by the Politecnico di Torino, and is sponsored by the Test Technology Technical Council (TTTC) of the IEEE Computer Society.

You are invited to participate and submit your contributions to ETS’08. The areas of interest of ETS’08 include (but are not limited to) the following topics:

Automatic Test Generation
Fault Modeling and Simulation
Current-Based Test
Power Issues in Test
Thermal Test
Delay and Performance Test
High-Speed IO/Interconnect Test
Signal Integrity Test
Nanometer Technologies Test
ATE Hardware and Software
Standards in Testing

Test(ability) Synthesis
Built-In Self Test (BIST)
Design for Test(ability) (DfT)
Test Data Compression
On-Line Test
Self-Repair Methodologies
Test of Reconfigurable Systems
Analog, Mixed-Signal, RF Test
Memory Test and Repair
Microprocessor Test
MEMS and Nanotechnology Test

Failure Analysis
Diagnosis and Debug
Design Verification and Validation
Test Quality and Reliability
Yield Analysis and Enhancement
Defect and Fault Tolerance
Board and System Test
(Embedded) System Test
High-Level DfT and TPG
System-in-Package (SiP) Test
System-on-Chip (SoC) Test

Publications

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ETS’08 will produce a Formal Proceedings, published by the IEEE Computer Society, and a Web-based Electronic Informal Digest of the selected papers. The best contributions will be selected for submission to regular issues of the “Journal of Electronic Testing: Theory and Applications” (JETTA), published by Springer. ETS’08 will present a Best Paper Award at ETS’09.

Submissions

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ETS'08 seeks original, unpublished contributions of the following types:

scientific papers presenting novel and complete research work
workshop-type papers, including ‘emerging ideas’ and ‘case studies’
‘Vendor Session’ presentations focusing on new features of test-related products
proposals for panels, embedded tutorials, and other special sessions.

Detailed submission instructions, including selection criteria and publication policies, for the various types of contributions are posted on the ETS web page.

TTTC Test Technology Educational Program (TTEP) tutorials on emerging test technology topics will be offered during ETS’08. Tutorial proposals should be submitted according to TTEP 2008 submission deadlines (http://computer.org/tab/tttc/teg/ttep).

As a new initiative for ETS’08, the organizing committee would like to encourage the organization of fringe workshops and will provide extensive support for the organization of such events. Full details can be found on the ETS web page.

Key Dates

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Submission deadline: December 7, 2007
Notification of acceptance: February 17, 2008
Camera-ready manuscript: March 16, 2008

Further Information

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Matteo Sonza Reorda – General Chair
Politecnico di Torino
Corso Duca degli Abruzzi, 24
10129 Torino, Italy
Tel.: +39-011-564-7055
Fax: +39-011-564-7099
Email: matteo.sonzareorda@polito.it

Patrick Girard – Program Chair
LIRMM
161, Rue Ada
34392 Montepellier, France
Tel.: +33-467-418-629
Fax: +33-467-418-500
E-mail: girard@lirmm.fr

Committees

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Organization Committee

General Chair / Vice Chair
M. Sonza Reorda – Politecnico di Torino (I)
J.L. Huertas Diaz – CNM (E)

Program Chair / Vice Chair
P. Girard – LIRMM (F)
Z. Peng – Linköping U. (S)

Topic Chairs
B. Becker – U. Freiburg (D)
S. Hellebrand – U. Paderborn (D)
H. Kerkhoff – U. Twente (NL)
E. Larsson – Linköping U. (S)
R. Leveugle – TIMA (F)
P. Muhmenthaler – Infineon (D)
N. Nicolici – McMaster U. (CAN)
M. Renovell – LIRMM (F)

Industrial Relations Chair
E. J. Marinissen – NXP (NL)

Publication co-Chairs
C. Metra – U. Bologna (I)
C. Landrault – LIRMM (F)

Panel Chair
H.-J. Wunderlich – U. Stuttgart (D)

Tutorial Chair
J. Figueras – UPC Barcelona (E)

Embedded Tutorial Chair
P. Prinetto – Politecnico di Torino (I)

ETS Fringe Workshops
B. Al-Hashimi – U. Southampton (UK)

Regional Liaisons
L. Carro – UFRGS (BR)
A. Singh – Auburn U. (USA)
A. Osseiran – Edith Cowan U. (AUS)
S. Kajihara – Kyushu IT (J)

Program Committee

E. Aas, N	S. Mir, F
M. Abadir, USA	S. Mitra, USA
R. Aitken, USA	Y. Miura, J
Z. Al-Ars, NL	F. Novak, SLO
D. Appello, I	O. Novak, CZ
F. Azais, F	A. Orailoglu, USA
L. Balado, E	S. Ozev, USA
A. Benso, I	A. Pataricza, H
G. Carlsson, S	F. Poehl, D
K. Chakrabarty, USA	I. Polian, D
W. Daehn, D	I. Pomeranz, USA
R. Dorsch, D	J. Raik, EE
M.-L. Flottes, F	J. Rajski, USA
H. Fujiwara, J	A. Richardson, UK
F. Fummi, I	J. Rivoir, D
D. Gizopoulos, GR	C. Robach, F
E, Gramatova, SK	B. Rouzeyre, F
S. Hamdioui, NL	A. Rubio, E
M. Hirech, USA	A. Rueda, E
A. Hlawiczka, PL	K.K. Saluja, USA
M. S. Hsiao, USA	P. Sanchez, E
P. Hughes, UK	J. Segura, E
A. Ivanov, CAN	B. Straube, D
R. Kapur, USA	J.-P. Teixeira, P
A. Krasniewski, PL	N. Touba, USA
B. Kruseman, NL	J. Tyszer, PL
S. Kundu, USA	R. Ubar, EE
M. Lubaszewski, BR	B. Vermeulen, NL
Y. Makris, USA	C. Wegener, D
H. Manhaeve, B	X. Wen, J
P. Maxwell, USA	C.-W. Wu, TW
L. Miclea, RO	M. Zwolinski, UK

Steering Committee

Chair: C. Landrault – LIRMM (F)

Al-Hashimi, UK	P. Prinetto, I
B. Becker, D	M. Renovell, F
J. Figueras, E	M. Sonza Reorda, I
E.J. Marinissen, NL	J.-P. Teixeira, P
P. Muhmenthaler, D	H.-J. Wunderlich, D
Z. Peng, S	Y. Zorian, USA

Organizing Committee

M. Rebaudengo	L. Sterpone
G. Squillero	E. Sanchez
M. Violante	P. Bernardi

For more information, visit us on the web at: http://www.ieee-ets.org/

The 12th IEEE European Test Symposium (ETS'07) is organized by the Albert-Ludwigs-University of Freiburg and sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

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	13th IEEE European Test Symposium (ETS'08) May 25-29, 2008 Lago Maggiore, ITALY http://www.ieee-ets.org/